• Français
  • Contact
    Advanced Search…
    • Log in
    International Organization of Legal Metrology
    • About
      • What is legal metrology
        • Legal metrology and trade
        • Legal metrology and safety
        • Legal metrology and health
        • Legal metrology and the environment
      • Memoranda of Understanding
        • IEC
        • ISO
        • UNIDO-BIPM
        • ILAC-IAF
      • INetQI
      • What is the OIML?
        • 70th OIML Anniversary
      • Organisations in Liaison
      • Policy and legislation
        • BIPM/OIML Brochure on D 1
      • Benefits of OIML membership
      • Joint declarations
    • Publications
      • Introduction
      • Documents
      • Vocabularies
        • Online Vocabularies
      • Seminar Reports
      • Recommendations
      • Basic Publications
      • Expert Reports
      • OIML Bulletin
        • Published Editions
        • Online Bulletin
          • 2024-10
        • Future Editions
        • Submitting an article
      • Guides
      • Other language translations
    • Structure
      • Our Members
        • Member States
        • Corresponding Members
      • Conference
        • Conference Sites, Resolutions, Minutes
        • 17th Conference (2025)
      • Digitalisation Task Group
        • Introduction
        • Overview
        • Digital transformation
        • SC Smart documents
        • SC e-Learning
        • Events
      • CIML
        • CIML meeting Sites, Resolutions, Minutes
        • Presidency
        • Past Presidents
        • Members of Honour
        • OIML Awards
          • OIML Medal
          • OIML Letter of Appreciation
          • OIML CEEMS Award
        • 17th Conference - 60th CIML Meeting (2025)
          • Venue
          • Registration - Proxies
          • Accommodation
          • Schedule
          • Meeting documents - CIML
          • Meeting documents - Conference
          • Contact information
      • TCs and SCs
      • Emerging Metrology Systems (CEEMS)
        • CEEMS Advisory Group
          • Advisory Group Membership
        • OIML Training Centers and Training Events
        • Training materials
        • Seminars
        • List of Experts
        • OIML CEEMS Award
          • 2022 CEEMS Award
        • Online learning from the OIML
          • MetTalks
        • BIPM/OIML Brochure on D 1
      • RLMO Round Table
        • RLMO RT 2024-09-30
        • RLMO RT 2023-09-26
        • RLMO RT 2022-09-27
        • RLMO RT 2021-09-30
        • RLMO RT 2020-10-08
    • News & Meetings
      • News
      • CIML Meetings
      • COP29
      • OIML meetings and events
      • OIML Seminars
        • Digital Transformation
      • OIML Conference
      • News archive
    • OIML-CS
      • OIML-CS Home
      • Introduction
      • Categories of measuring instruments
      • Documents, forms and guidance
      • Management structure
      • Info for OIML Issuing Authorities
      • Info for Utilizers and Associates
      • Info for manufacturers
      • News and events
      • News archive
      • Search registered certificates
      • Search OIML Issuing Authorities
      • Search Utilizers and Associates
      • Appeals, complaints and disputes
      • Contact
    • TC/SC/PG
      • TCs, SCs and Projects
      • Committee Drafts
      • Search (Technical)
      • Technical liaisons
    You are here:
    1. TC/SC/PG
    2. Technical Committees
    3. TC 15
    4. SC 2

    TC 15/SC 2 Measuring instruments for ionizing radiations used in industrial processes

    Ruler

    BIML Contact

    Mr Ian DUNMILL

    Secretariat

    • UNITED STATES
      Dr Katya DELAK

    Participating Members (6)

    • AUSTRIA
    • INDIA
    • IRAN
    • RUSSIAN FEDERATION
    • SOUTH AFRICA
    • UNITED STATES

    Observer Members (16)

    • AUSTRALIA
    • CUBA
    • CZECH REPUBLIC
    • DENMARK
    • FINLAND
    • FRANCE
    • GERMANY
    • HUNGARY
    • JAPAN
    • LIBERIA
    • P.R. CHINA
    • POLAND
    • ROMANIA
    • SLOVAKIA
    • SPAIN
    • SWITZERLAND

    Organisations in Liaison

    • IAEA International Atomic Energy Agency
    • ICRU International Commission on Radiation Units and Measurements
    • IEC International Electrotechnical Commission
    • ISO International Organization for Standardization

    Responsible for

    • R 127:1999 Radiochromic film dosimetry system for ionizing radiation processing of materials and products
    • R 131:2001 Polymethylmethacrylate (PMMA) dosimetry systems for ionizing radiation processing of materials and products
    • R 132:2001 Alanine EPR dosimetry systems for ionizing radiation processing of materials and products
    Return
    World Metrology Day 2025

    World Metrology Day 2025

    Read more
    70th OIML Anniversary

    70th OIML Anniversary

    Read more
    OIML Bulletin<br>October 2024

    OIML Bulletin
    October 2024

    Read more
    News & Meetings

    News & Meetings

    Read more
    Publications

    Publications

    Read more
    Online Learning

    Online Learning

    Read more
    • Contact BIML Staff
    • Practical Info
    • Disclaimer
    • Privacy and data protection policy
    • Webmaster
    OIML Logo
    BIML - 11 rue Turgot - 75009 Paris - France - Tel +33 1 48 78 12 82 - Fax +33 1 42 82 17 27
    © Copyright OIML 2021
    Web design: rouge-pixel.com