Toggle navigation
Français
Contact
Search Site
Advanced Search…
Log in
Toggle navigation
About
What is legal metrology
Legal metrology and trade
Legal metrology and safety
Legal metrology and health
Legal metrology and the environment
Memoranda of Understanding
IEC
ISO
UNIDO-BIPM
ILAC-IAF
INetQI
What is the OIML?
70th OIML Anniversary
Organisations in Liaison
Policy and legislation
BIPM/OIML Brochure on D 1
Benefits of OIML membership
Joint declarations
Publications
Introduction
Documents
Vocabularies
Online Vocabularies
Seminar Reports
Recommendations
Basic Publications
Expert Reports
OIML Bulletin
Future Editions
Past Editions and Index
Submitting an article
Online Bulletin
2024-04
Guides
Other language translations
Structure
Our Members
Member States
Corresponding Members
OIML Membership Map
Conference
Conference Sites, Resolutions, Minutes
About the BIML
Practical information
Past Directors
CIML
CIML meeting Sites, Resolutions, Minutes
Presidency
Past Presidents
Members of Honour
OIML Awards
OIML Medal
OIML Letter of Appreciation
OIML CEEMS Award
59th CIML Meeting
Invitation - English
Invitation - Français
Schedule
Registration - Proxies
Meeting documents
Contact information
Practical information
TCs and SCs
Digitalisation Task Group
Terms of Reference
OIML DTG Homepage
Emerging Metrology Systems (CEEMS)
CEEMS Advisory Group
Advisory Group Membership
OIML Training Centers and Training Events
Training materials
Seminars
List of Experts
OIML CEEMS Award
2022 CEEMS Award
Online learning from the OIML
MetTalks
BIPM/OIML Brochure on D 1
RLMO Round Table
RLMO RT 2023-09-26
RLMO RT 2022-09-27
RLMO RT 2021-09-30
RLMO RT 2020-10-08
News & Meetings
News
CIML Meetings
OIML meetings and events
OIML Seminars
Digital Transformation
OIML Conference
News archive
OIML-CS
OIML-CS Home
Introduction
Categories of measuring instruments
Documents, forms and guidance
Management structure
Info for OIML Issuing Authorities
Info for Utilizers and Associates
Info for manufacturers
News and events
News archive
Search registered certificates
Search OIML Issuing Authorities
Search Utilizers and Associates
Appeals, complaints and disputes
Contact
TC/SC/PG
TCs, SCs and Projects
Committee Drafts
Search (Technical)
Technical liaisons
You are here:
TC/SC/PG
Technical Committees
TC 6
Contacts
TC 6
Prepackaged products
Asia-Pacific Legal Metrology Forum
Return
